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True evolution True evolution True evolution

Welcome to a
true
evolution

Coating thickness measurement and materials analysis have just reached the next level of quality.
Experience the advantages of the powerful X-ray instruments of our new XDV® series now.

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Always ahead of the pulse

Our digital pulse processor DPP+ is your key to high intensity with short measurement time. Increase the pulse of your measurement now with the huge performance boost in every model of our new XDV® series.

Win
or win?

The DPP+ sets new standards in count rate. As a result, you can achieve far shorter measurement times or a significantly improved standard deviation. Your measurement wins or wins.

Up to any challenge

We know how multifaceted coating thickness measurement can be. With the most versatile software on the market and user-optimized operation, you are up to any challenge.

Those who know quality know FISCHER

Experience the new XDV® series from the global technology leader and put an exclamation mark on your non-destructive and contactless coating thickness measurement and material analysis.

Performance at its best

Discover the high-performance models of our XDV® series.

XDV®-SDD XDV®-SDD Close-Up XDV®-SDD Close-Up XDV®-µ XDV®-µ Close-Up XDV®-µ Close-Up XDV®-µ LD XDV®-µ LD Close-Up XDV®-µ LD Close-Up
XDV®-SDD XDV®-µ XDV®-µ LD

Up to
50%¹
increased performance


4-fold
changeable apertures


6-fold
changeable filters

The best XDV®-SDD ever! Together with the new DPP+ you get the most versatile instrument for single and multilayer coating thickness measurement as well as material analysis.

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¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.

Up to
50%¹
increased performance


Polycapillary
Produced in-house & constantly developed²


3 options
for the suitable polycapillary³

Experience superior stability and intensity with tiniest measurement spots. Thanks to the performance boost of the DPP+ and in combination with the polycapillary optics, you will get outstanding measurement results.

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¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.

² Polycapillary, which are constantly being further developed. High-end capillary optics made by Fischer - the world's only manufacturer of X-ray fluorescence measuring instruments with its own polycapillary production.

³ Three different high-end polycapillaries available - the right solution for each of your applications: 10 µm halo-free, 20 µm halo-free or 20 µm halo.

Up to
50%¹
increased performance


60 µm
smallest spot size


12 mm
largest measurement distance
– best in class!

Discover the highlight for complex shaped small parts. The unparalleled measuring distance combined with the tiniest measuring spot makes the XDV®-μ LD the industry-leading XRF instrument.

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¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.

Take a look under the hood of the XDV® series

Discover the powerful models of our XDV® series. At a glance here or readily for each model as a download.

XDV®-SDD Download
XDV®-µ Download
XDV®-µ LD Download
Use Measurement of very thin coatings < 0.05 µm and trace analysis in sub-promille range Measurement of tiniest structures and flat components, even complex coating systems Measurement of tiniest structures and complex shaped components, even complex coating systems
Application examples Gold, NiP, trace analysis e. g. according to RoHS Lead Frames, Bonding Wires, SMD components, Solder Bumbs, ENIG/ENEPIG Connectors, connector strips, pins and assembled PCB
Smallest measuring spot 0.25 mm 20 µm / 10 µm ⌀ 60 µm
Measurement distance 0 mm to 80 mm 4 mm to 5 mm / 1.5 mm to 2 mm Min. 12 mm
Max. sample size 140 mm 135 mm 135 mm
Apertures 4-fold changeable - -
Polycapillary - 20 µm halo (10 µm or 20 μm halo-free optional) 60 µm long distance capillary
Primary filter 6-fold changeable 4-fold changeable 4-fold changeable
Detector 50 mm² silicon drift detector 20 mm² silicon drift detector (50 mm² optional) 50 mm² silicon drift detector (20 mm² optional)
X-ray tube Microfocus tube with tungsten anode Microfocus tube with tungsten anode (molybdenum anode optional) Microfocus tube with tungsten anode (molybdenum anode optional)
Usable sample placement area 370mm x 320 mm 370mm x 320 mm (620mm x 530 mm optional) 370mm x 320 mm (620mm x 530 mm optional)
Approval Fully protected instrument with type approval Individual acceptance inspection as a fully protected instrument according to German radiation protection law Individual acceptance inspection as a fully protected instrument according to German radiation protection law
X-ray standards DIN ISO 3497, ASTM B 568 DIN ISO 3497, ASTM B 568, IPC-4552-A/B, IPC-4556 DIN ISO 3497, ASTM B 568, IPC-4552-A/B, IPC-4556

Launchclip

A true evolution presents itself. The XDV® series from FISCHER shines in a new design. Now equipped with the DPP+ processor by default, reduce your measurement times or improve your standard deviation like never before. This takes your quality control to the next level.

XDV®-Serie

Start your evolution with us

Get to know the new XDV® series without any obligation.
We will gladly introduce it to you.

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