คุณลักษณะของเครื่อง XDV® series
ค้นหารายละเอียดภาพรวม เครื่อง XDV® series ที่ทรงพลังของเรา หรือดาวนโหลดรุ่นที่เกี่ยวข้อง
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XDV® SDD
ดาวน์โหลด
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XDV®-µ
ดาวน์โหลด
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XDV®-µ LD
ดาวน์โหลด
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| Use | Measurement of very thin coatings < 0.05 µm and trace analysis in sub-promille range | Measurement of tiniest structures and flat components, even complex coating systems | Measurement of tiniest structures and complex shaped components, even complex coating systems |
| Application examples | Gold, NiP, trace analysis e. g. according to RoHS | Lead Frames, Bonding Wires, SMD components, Solder Bumbs, ENIG/ENEPIG | Connectors, connector strips, pins and assembled PCB |
| Smallest measuring spot | 0.25 mm | 20 µm / 10 µm | ⌀ 60 µm |
| Measurement distance | 0 mm to 80 mm | 4 mm to 5 mm / 1.5 mm to 2 mm | Min. 12 mm |
| Max. sample size | 140 mm | 135 mm | 135 mm |
| Apertures | 4-fold changeable | - | - |
| Polycapillary | - | 20 µm halo (10 µm or 20 μm halo-free optional) | 60 µm long distance capillary |
| Primary filter | 6-fold changeable | 4-fold changeable | 4-fold changeable |
| Detector | 50 mm² silicon drift detector | 20 mm² silicon drift detector (50 mm² optional) | 50 mm² silicon drift detector (20 mm² optional) |
| X-ray tube | Microfocus tube with tungsten anode | Microfocus tube with tungsten anode (molybdenum anode optional) | Microfocus tube with tungsten anode (molybdenum anode optional) |
| Usable sample placement area | 370mm x 320 mm | 370mm x 320 mm (620mm x 530 mm optional) | 370mm x 320 mm (620mm x 530 mm optional) |
| Approval | Fully protected instrument with type approval | Individual acceptance inspection as a fully protected instrument according to German radiation protection law | Individual acceptance inspection as a fully protected instrument according to German radiation protection law |
| X-ray standards | DIN ISO 3497, ASTM B 568 | DIN ISO 3497, ASTM B 568, IPC-4552-A/B, IPC-4556 | DIN ISO 3497, ASTM B 568, IPC-4552-A/B, IPC-4556 |
